Table 1

Measurement configurations for negative material design verification, and computed positive materials for producing the same negative refraction characteristics.

Ref. λ0 dx θp (°) nc m
[5] 23.8 mma 3.3 mmb 32.2 −1.05 6.16 −1
[6] 21 mma 3.3 mmb 12 −0.8 5.56 −1
[7] 28.6 mm 6 mm 18.4 −0.35 4.41 −1c
[7] 28.6 mm 6 mm 26.6 −0.35 4.41 −1c
[9] 5.6 mm 1.5 mm 26.6 −1 2.73 −1
[9] 5.22 mm 1.5 mm 26.6 −0.2 3.28 −1
[11] 1748 nma 75.2 nm 5 −1 22.2 −1
[12] 28.6 mm 5 mmb 20 −0.55 5.16 −1
a

A spectrum of λ0 values was employed; one was chosen as representative.

b

Not specified whether hypotenuse was serrated.

c

Two separate waves were measured.

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