Download original image
(a) The SEM image of the fabricated Si disk on a glass slip. (b) The simulated magnitude of the magnetic field profile of the incident APB without Si disk, and (c) in presence of the Si disk, both observed in a transverse cross section 5 nm above the disk upper boundary. (d) Preliminary result of a force map of the Si disk exposed to the incident APB measured by PiFM. Force is proportional to the magnitude square of the illuminating electric field . (e) Simulated magnitude of the electric field profile of the incident APB without the presence of the Si disk, and (f) in presence of the Si disk, still observed in a transverse cross section 5 nm above the disk upper boundary.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.