Figure 5.


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Measured and RCWA simulated reflectivity for (a) an electrically excitable SRR with gap oriented parallel to the wafer surface; (b) a magnetically excitable SRR with gap oriented perpendicular to the wafer surface. The data markers represent measured/modeled data points. The data has been normalized to unity by dividing every point by the maximum value, but is otherwise un-altered.

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