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Fig. 14


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Dependences of relative errors of PSD (a, c) and energy reflection coefficient (b, d) of wave 1 on the main layer (silver) thickness when the investigated multilayer is replaced by one main layer on the same substrate (d1,3,4 = 0) for various wavelengths of the incident TM polarized wave. For all the graphs, thicknesses d1,3 are given in the figures, d4 = 5 nm, ψ = π/6, ϵβ = − 0.2 + 0.1i, μβ = 1, the spacer layers material is SiO2 (ϵ1,3 = 2.13 + 2.92 × 10−7 i, µ1,3 = 1 [45,46]), and the additional layer parameters are: ϵ4 = 3 +0.5i, µ4 = 1.5 + 0.2i.

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