Open Access

Fig. 14

image

Download original image

Dependences of relative errors of PSD (a, c) and energy reflection coefficient (b, d) of wave 1 on the main layer (silver) thickness when the investigated multilayer is replaced by one main layer on the same substrate (d1,3,4 = 0) for various wavelengths of the incident TM polarized wave. For all the graphs, thicknesses d1,3 are given in the figures, d4 = 5 nm, ψ = π/6, ϵβ = − 0.2 + 0.1i, μβ = 1, the spacer layers material is SiO2 (ϵ1,3 = 2.13 + 2.92 × 10−7 i, µ1,3 = 1 [45,46]), and the additional layer parameters are: ϵ4 = 3 +0.5i, µ4 = 1.5 + 0.2i.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.